MICROWAVE MEASUREMENT OF THE SURFACE-RESISTANCE AND THE MAGNETIC PENETRATION DEPTH OF SMALL-AREA OF HIGH-T-C SUPERCONDUCTING THIN-FILMS BY DIELECTRIC RESONATOR

被引：0
作者：
MOURACHKINE, AP
BAREL, ARF
机构：
[1] Department ELEC, Free University of Brussels (VUB), 1050 Brussels
来源：
PHYSICA C | 1994年 / 235卷
关键词：
D O I：
10.1016/0921-4534(94)92142-3
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A simple technique of measuring microwave superconductor surface impedance using a dielectric resonator has been developed for small size samples (less than 5 mm x 5 mm). This method has advantages of simplicity to perform, nondestructive analysis, flexibility in sample size, and convenient experimental setup. YBCO (123) high-T-c superconducting films have been measured to verify the method. The measurements have been performed at 14.4 GHz and 77 K.
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页码：1841 / 1842
页数：2
相关论文
共 2 条
  • [1] KAJFEZ D, 1990, DIELECTRIC RESONATOR
  • [2] MOURACHKINE AP, IN PRESS IEEE T MTT
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