ANNEALING EFFECTS IN TUNNEL-JUNCTIONS (VOLTAGE ANNEALING)

[1] ADLER JG, 1975, REV SCI INSTRUM, V46, P158, DOI 10.1063/1.1134150

[2] TUNNELING CONDUCTANCE OF ASYMMETRICAL BARRIERS [J]. JOURNAL OF APPLIED PHYSICS, 1970, 41 (05) : 1915 - &

[3] ELLIPSOMETRICAL DETERMINATION OF BARRIER THICKNESSES OF METAL-INSULATOR-METAL TUNNEL JUNCTIONS [J]. SOLID STATE COMMUNICATIONS, 1973, 12 (07) : 615 - 619

[4] ANNEALING EFFECTS IN TUNNEL-JUNCTIONS (THERMAL ANNEALING) [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (12) : 8125 - 8128

[5] USE OF BARRIER PARAMETERS FOR CHARACTERIZATION OF ELECTRON-TUNNELING CONDUCTANCE CURVES [J]. SOLID STATE COMMUNICATIONS, 1978, 26 (12) : 949 - 952

[6] EFFECT OF COVER ELECTRODE METAL ON INELASTIC ELECTRON-TUNNELING STRUCTURE [J]. SURFACE SCIENCE, 1977, 69 (02) : 437 - 443

[7] SIMMONS JG, 1963, PHYS REV LETT, V1, P10

[1] ADLER JG, 1975, REV SCI INSTRUM, V46, P158, DOI 10.1063/1.1134150

[2] TUNNELING CONDUCTANCE OF ASYMMETRICAL BARRIERS [J]. JOURNAL OF APPLIED PHYSICS, 1970, 41 (05) : 1915 - &

[3] ELLIPSOMETRICAL DETERMINATION OF BARRIER THICKNESSES OF METAL-INSULATOR-METAL TUNNEL JUNCTIONS [J]. SOLID STATE COMMUNICATIONS, 1973, 12 (07) : 615 - 619

[4] ANNEALING EFFECTS IN TUNNEL-JUNCTIONS (THERMAL ANNEALING) [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (12) : 8125 - 8128

[5] USE OF BARRIER PARAMETERS FOR CHARACTERIZATION OF ELECTRON-TUNNELING CONDUCTANCE CURVES [J]. SOLID STATE COMMUNICATIONS, 1978, 26 (12) : 949 - 952

[6] EFFECT OF COVER ELECTRODE METAL ON INELASTIC ELECTRON-TUNNELING STRUCTURE [J]. SURFACE SCIENCE, 1977, 69 (02) : 437 - 443

[7] SIMMONS JG, 1963, PHYS REV LETT, V1, P10