QUANTIFICATION OF AUGER DEPTH PROFILES BY MEANS OF RUTHERFORD BACKSCATTERING SPECTROMETRY

被引：0
|
作者：
DERUGY, H [1 ]
SALIOT, P [1 ]
PANTEL, R [1 ]
机构：
[1] CTR NATL ETUD TELECOMMUN,F-38240 MEYLAN,FRANCE
来源：
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1989年 / 333卷 / 4-5期
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中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
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页码：331 / 332
页数：2
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