ACCURATE LASER WAVELENGTH MEASUREMENT WITH A PRECISION 2-BEAM SCANNING MICHELSON INTERFEROMETER

被引：92
作者：
MONCHALIN, JP
KELLY, MJ
THOMAS, JE
KURNIT, NA
SZOKE, A
ZERNIKE, F
LEE, PH
JAVAN, A
机构：
[1] PERKIN ELMER CORP,NORWALK,CT 06852
[2] MIT,CAMBRIDGE,MA 02139
[3] UNIV CALIF SANTA BARBARA,DEPT PHYS,SANTA BARBARA,CA 92706
来源：
APPLIED OPTICS | 1981年 / 20卷 / 05期
关键词：
D O I：
10.1364/AO.20.000736
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：736 / 757
页数：22
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