Chemical analysis by x-ray diffraction - Classification and use of x-ray diffraction patterns

被引：590

作者：

Hanawalt, JD ^{[1
]}

Rinn, HW ^{[1
]}

Frevel, LK ^{[1
]}

机构：

[1] Dow Chem Co, Midland, MI USA

来源：

INDUSTRIAL AND ENGINEERING CHEMISTRY-ANALYTICAL EDITION | 1938年 / 10卷

关键词：

D O I：

10.1021/ac50125a001

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：0457 / 0512

页数：56

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