Chemical analysis by x-ray diffraction - Classification and use of x-ray diffraction patterns

被引：601
作者：
Hanawalt, JD [1 ]
Rinn, HW [1 ]
Frevel, LK [1 ]
机构：
[1] Dow Chem Co, Midland, MI USA
来源：
INDUSTRIAL AND ENGINEERING CHEMISTRY-ANALYTICAL EDITION | 1938年 / 10卷
关键词：
D O I：
10.1021/ac50125a001
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：0457 / 0512
页数：56
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