PRECISION MILLIMETER-WAVE DIELECTRIC MEASUREMENTS OF BIREFRINGENT CRYSTALLINE SAPPHIRE AND CERAMIC ALUMINA

被引：15

作者：

AFSAR, MN ^{[1
]}

机构：

[1] MIT,FRANCIS BITTER NATL MAGNET LAB,CAMBRIDGE,MA 02139

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1987年 / 36卷 / 02期

关键词：

D O I：

10.1109/TIM.1987.6312739

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：554 / 559

页数：6

共 12 条

[1]

Afsar M. N., 1977, IEEE Transactions on Microwave Theory and Techniques, VMTT-25, P509, DOI 10.1109/TMTT.1977.1129147

[2] NEW TECHNIQUES FOR DISPERSIVE FOURIER-TRANSFORM SPECTROMETRY OF LIQUIDS [J].

AFSAR, MN ;

HASTED, JB ;

CHAMBERLAIN, J .

INFRARED PHYSICS, 1976, 16 (1-2) :301-310

[3] DIELECTRIC MEASUREMENTS OF MILLIMETER-WAVE MATERIALS [J].

AFSAR, MN .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1984, 32 (12) :1598-1609

[4] SUBMILLIMETER-WAVE MEASUREMENTS ON LIQUID DIELECTRICS [J].

AFSAR, MN .

PROCEEDINGS OF THE IEEE, 1979, 67 (10) :1460-1463

[5] MILLIMETER AND SUBMILLIMETER WAVE MEASUREMENTS OF COMPLEX OPTICAL AND DIELECTRIC PARAMETERS OF MATERIALS .1. 2.5 MM TO 0.66 MM FOR ALUMINA-995, BERYLLIA, FUSED-SILICA, BORO-SILICATE AND GLASS CERAMIC [J].

AFSAR, MN ;

BUTTON, KJ .

INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES, 1981, 2 (05) :1029-1044

[6] MEASUREMENTS OF OPTICAL-CONSTANTS OF LIQUID H2O AND D2O BETWEEN 6 AND 450 CM-1 [J].

AFSAR, MN ;

HASTED, JB .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1977, 67 (07) :902-904

[7] PRECISE MILLIMETER-WAVE MEASUREMENTS OF COMPLEX REFRACTIVE-INDEX, COMPLEX DIELECTRIC PERMITTIVITY AND LOSS TANGENT OF GAAS, SI, SIO2, AL2O3, BEO, MACOR, AND GLASS [J].

AFSAR, MN ;

BUTTON, KJ .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1983, 31 (02) :217-223

[8] MILLIMETER-WAVE DIELECTRIC MEASUREMENT OF MATERIALS [J].

AFSAR, MN ;

BUTTON, KJ .

PROCEEDINGS OF THE IEEE, 1985, 73 (01) :131-153

[9]

AFSAR MN, 1978, THESIS U LONDON LOND

[10]

AFSAR MN, 1977, DES42 NAT PHYS LAB R

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