THICKNESS PERIODICITY IN THE AUGER LINE-SHAPE FROM EPITAXIAL (111)CU FILMS

被引：24
|
作者：
NAMBA, Y
VOOK, RW
CHAO, SS
机构：
来源：
SURFACE SCIENCE | 1981年 / 109卷 / 02期
关键词：
D O I：
10.1016/0039-6028(81)90490-8
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：320 / 330
页数：11
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