NANOSECOND TIME-RESOLVED VACUUM-ULTRAVIOLET SPECTROMETER FOR ION DIODE SPECTROSCOPY

A 1-m normal incidence spectrometer has been modified for use as a diagnostic of ion diode plasmas. To improve instrumental sensitivity, an elliptical mirror images an anode surface plasma onto the entrance slit of an f/10 normal incidence spectrometer. The detector is a time-resolving copper iodide coated microchannel plate stripline framing camera with 60-mum resolution, limiting instrumental resolution to 1 angstrom with a 600 l/mm grating in first order. Reflectivity of optics and photoelectron efficiency limit the spectral range from 400 to 2000 angstrom. With a 600-l/mm grating the detector spans a 600-angstrom range. Applications of the instrument may include ion source divergence measurements from Doppler broadening, electric field measurements from Stark splittings or shifts, electron temperature from mean ionization state, and magnetic field measurements on high-power Z pinches from Zeeman splitting.