THE OPTIMUM DESIGN OF THIN-FILM TRANSISTORS BY DYNAMIC CHARACTERISTICS MEASUREMENT

被引：0

作者：

YAMADA, T

OHIMA, S

KIHARA, K

JINNO, Y

OKITA, Y

ARIOKA, T

YAMAGUCHI, T

NAKAKADO, T

机构：

[1] Semiconductor Research Center, Sanyo Electric Co, Kobe

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1990年 / 29卷 / 12期

关键词：

DYNAMIC CHARACTERISTICS; LIQUID CRYSTAL DISPLAY; THIN FILM TRANSISTOR; ELECTRICAL PROPERTY; GATE SIGNAL DISTORTION;

D O I：

10.1143/JJAP.29.L2363

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

By measuring the voltage from the source electrode of the TEG-TFTs, the dynamic characteristics of TFT-LCDs have been analysed. It was clearly determined that the V(rms) decrement depends on the increase in the delay time of the gate signal. Under the H-reversed half-line driving method, both the time lag between the drain and the gate signal and the size of TFTs were both optimized. We were able to obtain these results on the condition that tau-delay was equal to 1/3 of the on-time of the gate signal.

引用

页码：L2363 / L2365

页数：3

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