A SUPERLATTICE GAAS/INGAAS-ON-GAAS PHOTODETECTOR FOR 1.3-MU-M APPLICATIONS

被引:13
作者
ZIRNGIBL, M
BISCHOFF, JC
THERON, D
ILEGEMS, M
机构
关键词
D O I
10.1109/55.29671
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
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页码:336 / 338
页数:3
相关论文
共 13 条
[1]  
BISCHOFF JC, 1988, J PHYS, V49
[2]  
BULMAN GE, 1986, J ELECTRON MATER, V16, P221
[3]  
DAS U, 1987, APPL PHYS LETT, V1, P1164
[4]   GROWTH AND CHARACTERIZATION OF ALGAAS/INGAAS/GAAS PSEUDOMORPHIC STRUCTURES [J].
FISCHERCOLBRIE, A ;
MILLER, JN ;
LADERMAN, SS ;
ROSNER, SJ ;
HULL, R .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (02) :620-624
[5]   CONTROVERSY OF CRITICAL LAYER THICKNESS FOR INGAAS/GAAS STRAINED-LAYER EPITAXY [J].
GOURLEY, PL ;
FRITZ, IJ ;
DAWSON, LR .
APPLIED PHYSICS LETTERS, 1988, 52 (05) :377-379
[6]   LOW-LEAKAGE INGAAS PHOTODIODES GROWN ON GAAS SUBSTRATES USING A GRADED STRAINED-LAYER SUPERLATTICE [J].
HODSON, PD ;
WALLIS, RH ;
DAVIES, JI .
ELECTRONICS LETTERS, 1987, 23 (06) :273-275
[7]   OPTICAL INVESTIGATION OF HIGHLY STRAINED INGAAS-GAAS MULTIPLE QUANTUM-WELLS [J].
JI, G ;
HUANG, D ;
REDDY, UK ;
HENDERSON, TS ;
HOUDRE, R ;
MORKOC, H .
JOURNAL OF APPLIED PHYSICS, 1987, 62 (08) :3366-3373
[8]   DEFECTS IN EPITAXIAL MULTILAYERS .1. MISFIT DISLOCATIONS [J].
MATTHEWS, JW ;
BLAKESLEE, AE .
JOURNAL OF CRYSTAL GROWTH, 1974, 27 (DEC) :118-125
[9]   INXGA1-XAS-INYGA1-YAS STRAINED-LAYER SUPER-LATTICES - A PROPOSAL FOR USEFUL, NEW ELECTRONIC MATERIALS [J].
OSBOURN, GC .
PHYSICAL REVIEW B, 1983, 27 (08) :5126-5128
[10]   PLANAR MONOLITHIC INTEGRATED PHOTORECEIVER FOR 1.3-1.55 MU-M WAVELENGTH APPLICATIONS USING GALNAS-GAAS HETEROEPITAXIES [J].
RAZEGHI, M ;
RAMDANI, J ;
VERRIELE, H ;
DECOSTER, D ;
CONSTANT, M ;
VANBREMEERSCH, J .
APPLIED PHYSICS LETTERS, 1986, 49 (04) :215-217