KINEMATICAL SIMULATION OF HIGH-RESOLUTION X-RAY-DIFFRACTION CURVES OF GEXSI1-X/SI STRAINED-LAYER SUPERLATTICES - A STRUCTURAL ASSESSMENT

被引：30
作者：
VANDENBERG, JM
BEAN, JC
HAMM, RA
HULL, R
机构：
来源：
APPLIED PHYSICS LETTERS | 1988年 / 52卷 / 14期
关键词：
D O I：
10.1063/1.99189
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
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页码：1152 / 1154
页数：3
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