PREPARATION OF STM TIPS FOR INSITU CHARACTERIZATION OF ELECTRODE SURFACES

被引：54

作者：

HEBEN, MJ

DOVEK, MM

LEWIS, NS

PENNER, RM

QUATE, CF

机构：

[1] CALTECH, DIV CHEM & CHEM ENGN, PASADENA, CA 91125 USA

[2] STANFORD UNIV, DEPT APPL PHYS, STANFORD, CA 94305 USA

来源：

JOURNAL OF MICROSCOPY | 1988年 / 152卷

关键词：

D O I：

10.1111/j.1365-2818.1988.tb01434.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：651 / 661

页数：11

共 29 条

[1] LINEAR SWEEP VOLTAMMETRY AT VERY SMALL STATIONARY DISK ELECTRODES [J].

AOKI, K ;

AKIMOTO, K ;

TOKUDA, K ;

MATSUDA, H ;

OSTERYOUNG, J .

JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1984, 171 (1-2) :219-230

[2] SCANNING TUNNELING MICROSCOPY AND ELECTROCHEMISTRY [J].

ARVIA, AJ .

SURFACE SCIENCE, 1987, 181 (1-2) :78-91

[3]

BINNIG G, 1984, PHYSICA B & C, V127, P37, DOI 10.1016/S0378-4363(84)80008-X

[4] SCANNING TUNNELING MICROSCOPY [J].

BINNIG, G ;

ROHRER, H .

SURFACE SCIENCE, 1983, 126 (1-3) :236-244

[5] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].

BINNING, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61

[6] FARADAIC ELECTROCHEMISTRY AT MICRO-VOLTAMMETRIC ELECTRODES [J].

DAYTON, MA ;

BROWN, JC ;

STUTTS, KJ ;

WIGHTMAN, RM .

ANALYTICAL CHEMISTRY, 1980, 52 (06) :946-950

[7] LOCAL ELECTRONIC-STRUCTURE AND SURFACE GEOMETRY OF AG ON SI(111) [J].

DEMUTH, JE ;

VONLENEN, EJ ;

TROMP, RM ;

HAMERS, RJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (01) :18-26

[8]

DOVEK MM, 1988, ACS SYM SER, V378, P174

[9]

DOVEK MM, IN PRESS REV SCI INS

[10] INSITU SCANNING TUNNELING MICROSCOPY OF THE ANODIC-OXIDATION OF HIGHLY ORIENTED PYROLYTIC-GRAPHITE SURFACES [J].

GEWIRTH, AA ;

BARD, AJ .

JOURNAL OF PHYSICAL CHEMISTRY, 1988, 92 (20) :5563-5566

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