2D DISPLACEMENT PATTERN IN TSEF-TCNQ MODEL ANALYSIS OF THE 2KF DIFFUSE LINES

被引:17
|
作者
YAMAJI, K [1 ]
MEGTERT, S [1 ]
COMES, R [1 ]
机构
[1] UNIV PARIS 11,CNRS,PHYS SOLIDES LAB,F-91405 ORSAY,FRANCE
来源
JOURNAL DE PHYSIQUE | 1981年 / 42卷 / 09期
关键词
D O I
10.1051/jphys:019810042090132700
中图分类号
学科分类号
摘要
引用
收藏
页码:1327 / 1343
页数:17
相关论文
共 50 条
  • [1] 2D DISPLACEMENT PATTERN IN TSEF-TCNQ OBTAINED FROM X-RAY 2KF SCATTERING
    YAMAJI, K
    MEGTERT, S
    COMES, R
    CHEMICA SCRIPTA, 1981, 17 (1-5): : 35 - 36
  • [2] ANALYSIS OF 2KF X-RAY DIFFUSE-SCATTERING INTENSITY IN HMTSF-TCNQ
    YAMAJI, K
    POUGET, JP
    COMES, R
    BECHGAARD, K
    JOURNAL DE PHYSIQUE, 1983, 44 (NC-3): : 1321 - 1323
  • [3] 2KF AND 4KF CHARGE-DENSITY WAVES IN TTF0.4TSEF0.6-TCNQ - AN X-RAY STUDY
    KAGOSHIMA, S
    ISHIGURO, T
    ENGLER, EM
    SCHULTZ, TD
    TOMKIEWICZ, Y
    SOLID STATE COMMUNICATIONS, 1980, 34 (03) : 151 - 155
  • [4] X-RAY DIFFUSE-SCATTERING STUDY OF 2KF AND 4KF ANOMALIES IN STRONGLY IRRADIATED TTF-TCNQ
    FORRO, L
    BOUFFARD, S
    POUGET, JP
    JOURNAL DE PHYSIQUE LETTRES, 1984, 45 (11): : L543 - L549
  • [5] 2KF AND 4KF CORRELATION-FUNCTIONS FOR 1-D HUBBARD-MODEL
    BRAY, JW
    CHUI, ST
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (03): : 356 - 356
  • [6] COEXISTENCE OF 2KF AND 4KF INSTABILITIES IN A MODEL OF A 1D ELECTRON-GAS
    NOGUERA, C
    EMERY, VJ
    SYNTHETIC METALS, 1989, 29 (2-3) : F523 - F530
  • [8] Pattern selection in the 2D FitzHugh–Nagumo model
    G. Gambino
    M. C. Lombardo
    G. Rubino
    M. Sammartino
    Ricerche di Matematica, 2019, 68 : 535 - 549
  • [9] Quantum phase transitions and collapse of the Mott gap in the d=1+ε dimensional Hubbard model with 2kF umklapp scattering
    Kishine, J
    PHYSICAL REVIEW B, 2000, 62 (04): : 2377 - 2387
  • [10] Structural Analysis and Electronic Properties of Negatively Charged TCNQ: 2D Networks (TCNQ)2Mn Assembled on Cu(100)
    Shi, X. Q.
    Lin, Chensheng
    Minot, C.
    Tseng, Tzu-Chun
    Tait, Steven L.
    Lin, Nian
    Zhang, R. Q.
    Kern, Klaus
    Cerda, J. I.
    Van Hove, M. A.
    JOURNAL OF PHYSICAL CHEMISTRY C, 2010, 114 (40): : 17197 - 17204