WORK-FUNCTION ANISOTROPIES AS AN ORIGIN OF LONG-RANGE SURFACE FORCES

被引：78

作者：

BURNHAM, NA

COLTON, RJ

POLLOCK, HM

机构：

[1] USN, RES LAB, SURFACE CHEM BRANCH, WASHINGTON, DC 20375 USA

[2] UNIV LANCASTER, SCH PHYS & MAT, LANCASTER LA1 4YB, ENGLAND

来源：

PHYSICAL REVIEW LETTERS | 1992年 / 69卷 / 01期

关键词：

D O I：

10.1103/PhysRevLett.69.144

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Unusual effects noticed in previous force microscopy data are explained by a model based on work-function anisotropies and their associated patch charges. Measurable forces between macroscopic bodies can be due to the interaction of patch charges, with important consequences in the fields of surface forces, contact mechanics, adhesion, Schottky barriers, and the surface properties of insulators.

引用

页码：144 / 147

页数：4

共 20 条

[1]

ASHCROFT NW, 1976, SOLID STATE PHYS, P358

[2] INTERACTION FORCES OF A SHARP TUNGSTEN TIP WITH MOLECULAR FILMS ON SILICON SURFACES [J].

BLACKMAN, GS ;

MATE, CM ;

PHILPOTT, MR .

PHYSICAL REVIEW LETTERS, 1990, 65 (18) :2270-2273

[3]

BLEANEY BI, 1976, ELECTRICITY MAGNETIS, P55

[4] INTERPRETATION ISSUES IN FORCE MICROSCOPY [J].

BURNHAM, NA ;

COLTON, RJ ;

POLLOCK, HM .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (04) :2548-2556

[5] PROBING THE SURFACE FORCES OF MONOLAYER FILMS WITH AN ATOMIC-FORCE MICROSCOPE [J].

BURNHAM, NA ;

DOMINGUEZ, DD ;

MOWERY, RL ;

COLTON, RJ .

PHYSICAL REVIEW LETTERS, 1990, 64 (16) :1931-1934

[6] MEASURING THE NANOMECHANICAL PROPERTIES AND SURFACE FORCES OF MATERIALS USING AN ATOMIC FORCE MICROSCOPE [J].

BURNHAM, NA ;

COLTON, RJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (04) :2906-2913

[7]

BURNHAM NA, IN PRESS SCANNING TU

[8] EFFECTIVE CHARGES AND THE SURFACE STABILITY OF O ON CU(001) [J].

COLBOURN, EA ;

INGLESFIELD, JE .

PHYSICAL REVIEW LETTERS, 1991, 66 (15) :2006-2009

[9] DIRECT MEASUREMENT OF THE SHORT-RANGE INTERACTION BETWEEN A TUNGSTEN TIP AND A MICA SURFACE [J].

GAUTHIERMANUEL, B .

EUROPHYSICS LETTERS, 1992, 17 (03) :195-200

[10] SCANNING TUNNELING MICROSCOPY AND ATOMIC FORCE MICROSCOPY - APPLICATION TO BIOLOGY AND TECHNOLOGY [J].

HANSMA, PK ;

ELINGS, VB ;

MARTI, O ;

BRACKER, CE .

SCIENCE, 1988, 242 (4876) :209-216

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