ELEMENTAL ANALYSIS OF THICK AMORPHOUS SPECIMENS BY EELS

被引：9

作者：

CHENG, SC

EGERTON, RF

机构：

[1] Physics Department, University of Alberta, Edmonton

来源：

MICRON | 1993年 / 24卷 / 03期

关键词：

TEM; EELS; ANALYTICAL ELECTRON MICROSCOPY; ELEMENTAL ANALYSIS;

D O I：

10.1016/0968-4328(93)90050-B

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Changes in the relative intensity of ionization edges with increasing specimen thickness are shown to arise from the influence of elastic scattering on the energy-loss spectrum. In the case of an amorphous specimen, the resulting error in measured elemental composition can be minimised by using a medium-sized (e.g. 20 mrad) collection aperture, or may be corrected for by applying the Lenz model of elastic scattering.

引用

页码：251 / 256

页数：6

共 9 条

[1]

ALLEN LJ, 1992, ULTRAMICROSCOPY, V48, P97

[2] DEADTIME CORRECTIONS FOR A PULSE COUNTING SYSTEM IN ELECTRON-ENERGY LOSS SPECTROSCOPY [J].