EXCHANGE-CORRELATION POTENTIALS AT SEMICONDUCTOR INTERFACES

被引:30
|
作者
GODBY, RW [1 ]
SHAM, LJ [1 ]
机构
[1] UNIV CALIF SAN DIEGO, DEPT PHYS, LA JOLLA, CA 92093 USA
来源
PHYSICAL REVIEW B | 1994年 / 49卷 / 03期
关键词
D O I
10.1103/PhysRevB.49.1849
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We investigate the exact Kohn-Sham exchange-correlation potential at semiconductor interfaces, including Schottky barriers, heterojunctions, and semiconductor surfaces. By considering the electron density at the interface, we deduce the way in which the exact exchange-correlation potential differs from its bulk counterpart. The potential has a slow spatial variation related to the discontinuity, Delta, that occurs on addition of an electron to the bulk semiconductor. This variation, which corresponds to an ultra-non-local ''vertex correction'' in the Kohn-Sham formulation of the dielectric response of the semiconductor, results in correction terms for Schottky barrier heights and band offsets calculated using Kohn-Sham orbital energies. The effect is exhibited numerically for a model semiconductor.
引用
收藏
页码:1849 / 1857
页数:9
相关论文
共 50 条