DETERMINATION OF SHALLOW CORE LEVEL SPECTRA IN SELECTED COMPOUND SEMICONDUCTORS

被引：16

作者：

DAVIS, GD ^{[1
]}

VILJOEN, PE ^{[1
]}

LAGALLY, MG ^{[1
]}

机构：

[1] UNIV WISCONSIN,MAT SCI BRANCH,MADISON,WI 53706

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1980年 / 20卷 / 04期

关键词：

D O I：

10.1016/0368-2048(80)85026-2

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：305 / 318

页数：14

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