STRUCTURE OF SILICON MONOXIDE

被引:23
作者
LIN, SCH
JOSHI, M
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D O I
10.1149/1.2411690
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
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页码:1740 / +
页数:1
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共 7 条
[1]   A STUDY OF AMORPHOUS SIO [J].
BRADY, GW .
JOURNAL OF PHYSICAL CHEMISTRY, 1959, 63 (07) :1119-1120
[2]   STRUCTURE OF SILICON OXIDE FILMS [J].
COLEMAN, MV ;
THOMAS, DJD .
PHYSICA STATUS SOLIDI, 1967, 22 (02) :593-&
[3]   ATOMIC STRUCTURE AND CORRELATION IN VITREOUS SILICA BY X-RAY AND NEUTRON DIFFRACTION [J].
HENNINGE.EH ;
BUSCHERT, RC ;
HEATON, L .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1967, 28 (03) :423-&
[4]  
LIN SH, TO BE PUBLISHED
[5]   STRUCTURAL EVALUATION OF SILICON OXIDE FILMS [J].
PLISKIN, WA ;
LEHMAN, HS .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1965, 112 (10) :1013-&
[6]   OPTICAL ABSORPTION IN SILICON MONOXIDE [J].
RAWLINGS, IR .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1968, 1 (06) :733-&
[7]   SILICON VALENCE IN SIO FILMS STUDIED BY X-RAY EMISSION [J].
WHITE, EW ;
ROY, R .
SOLID STATE COMMUNICATIONS, 1964, 2 (06) :151-152