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STRUCTURE OF SILICON MONOXIDE
被引:23
作者
:
LIN, SCH
论文数:
0
引用数:
0
h-index:
0
LIN, SCH
JOSHI, M
论文数:
0
引用数:
0
h-index:
0
JOSHI, M
机构
:
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1969年
/ 116卷
/ 12期
关键词
:
D O I
:
10.1149/1.2411690
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
引用
收藏
页码:1740 / +
页数:1
相关论文
共 7 条
[1]
A STUDY OF AMORPHOUS SIO
[J].
BRADY, GW
论文数:
0
引用数:
0
h-index:
0
BRADY, GW
.
JOURNAL OF PHYSICAL CHEMISTRY,
1959,
63
(07)
:1119
-1120
[2]
STRUCTURE OF SILICON OXIDE FILMS
[J].
COLEMAN, MV
论文数:
0
引用数:
0
h-index:
0
COLEMAN, MV
;
THOMAS, DJD
论文数:
0
引用数:
0
h-index:
0
THOMAS, DJD
.
PHYSICA STATUS SOLIDI,
1967,
22
(02)
:593
-&
[3]
ATOMIC STRUCTURE AND CORRELATION IN VITREOUS SILICA BY X-RAY AND NEUTRON DIFFRACTION
[J].
HENNINGE.EH
论文数:
0
引用数:
0
h-index:
0
HENNINGE.EH
;
BUSCHERT, RC
论文数:
0
引用数:
0
h-index:
0
BUSCHERT, RC
;
HEATON, L
论文数:
0
引用数:
0
h-index:
0
HEATON, L
.
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1967,
28
(03)
:423
-&
[4]
LIN SH, TO BE PUBLISHED
[5]
STRUCTURAL EVALUATION OF SILICON OXIDE FILMS
[J].
PLISKIN, WA
论文数:
0
引用数:
0
h-index:
0
PLISKIN, WA
;
LEHMAN, HS
论文数:
0
引用数:
0
h-index:
0
LEHMAN, HS
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1965,
112
(10)
:1013
-&
[6]
OPTICAL ABSORPTION IN SILICON MONOXIDE
[J].
RAWLINGS, IR
论文数:
0
引用数:
0
h-index:
0
RAWLINGS, IR
.
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
1968,
1
(06)
:733
-&
[7]
SILICON VALENCE IN SIO FILMS STUDIED BY X-RAY EMISSION
[J].
WHITE, EW
论文数:
0
引用数:
0
h-index:
0
WHITE, EW
;
ROY, R
论文数:
0
引用数:
0
h-index:
0
ROY, R
.
SOLID STATE COMMUNICATIONS,
1964,
2
(06)
:151
-152
←
1
→
共 7 条
[1]
A STUDY OF AMORPHOUS SIO
[J].
BRADY, GW
论文数:
0
引用数:
0
h-index:
0
BRADY, GW
.
JOURNAL OF PHYSICAL CHEMISTRY,
1959,
63
(07)
:1119
-1120
[2]
STRUCTURE OF SILICON OXIDE FILMS
[J].
COLEMAN, MV
论文数:
0
引用数:
0
h-index:
0
COLEMAN, MV
;
THOMAS, DJD
论文数:
0
引用数:
0
h-index:
0
THOMAS, DJD
.
PHYSICA STATUS SOLIDI,
1967,
22
(02)
:593
-&
[3]
ATOMIC STRUCTURE AND CORRELATION IN VITREOUS SILICA BY X-RAY AND NEUTRON DIFFRACTION
[J].
HENNINGE.EH
论文数:
0
引用数:
0
h-index:
0
HENNINGE.EH
;
BUSCHERT, RC
论文数:
0
引用数:
0
h-index:
0
BUSCHERT, RC
;
HEATON, L
论文数:
0
引用数:
0
h-index:
0
HEATON, L
.
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1967,
28
(03)
:423
-&
[4]
LIN SH, TO BE PUBLISHED
[5]
STRUCTURAL EVALUATION OF SILICON OXIDE FILMS
[J].
PLISKIN, WA
论文数:
0
引用数:
0
h-index:
0
PLISKIN, WA
;
LEHMAN, HS
论文数:
0
引用数:
0
h-index:
0
LEHMAN, HS
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1965,
112
(10)
:1013
-&
[6]
OPTICAL ABSORPTION IN SILICON MONOXIDE
[J].
RAWLINGS, IR
论文数:
0
引用数:
0
h-index:
0
RAWLINGS, IR
.
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
1968,
1
(06)
:733
-&
[7]
SILICON VALENCE IN SIO FILMS STUDIED BY X-RAY EMISSION
[J].
WHITE, EW
论文数:
0
引用数:
0
h-index:
0
WHITE, EW
;
ROY, R
论文数:
0
引用数:
0
h-index:
0
ROY, R
.
SOLID STATE COMMUNICATIONS,
1964,
2
(06)
:151
-152
←
1
→