MAGNETIC CONTRAST IN SECONDARY-ELECTRON IMAGES OF UNIAXIAL FERROMAGNETIC MATERIALS OBTAINED BY SCANNING ELECTRON-MICROSCOPY

被引：18

|

作者：

YAMAMOTO, T ^{[1
]}

TSUNO, K ^{[1
]}

机构：

[1] JAPAN ELECTRON OPTICS LAB CO LTD,AKISHIMA,TOKYO,JAPAN

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1975年 / 28卷 / 02期

关键词：

D O I：

10.1002/pssa.2210280212

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：479 / 487

页数：9

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