MAGNETIC CONTRAST IN SECONDARY-ELECTRON IMAGES OF UNIAXIAL FERROMAGNETIC MATERIALS OBTAINED BY SCANNING ELECTRON-MICROSCOPY

被引：18
|
作者：
YAMAMOTO, T [1 ]
TSUNO, K [1 ]
机构：
[1] JAPAN ELECTRON OPTICS LAB CO LTD,AKISHIMA,TOKYO,JAPAN
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1975年 / 28卷 / 02期
关键词：
D O I：
10.1002/pssa.2210280212
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：479 / 487
页数：9
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