HELIUM SOURCE MICROWAVE-INDUCED PLASMA MASS-SPECTROMETRIC DETECTION IN THE ANALYSIS OF GAS-CHROMATOGRAPHIC ELUATES

被引：44

作者：

CREED, JT ^{[1
]}

MOHAMAD, AH ^{[1
]}

DAVIDSON, TM ^{[1
]}

ATAMAN, G ^{[1
]}

CARUSO, JA ^{[1
]}

机构：

[1] UNIV CINCINNATI,DEPT CHEM,CINCINNATI,OH 45221

来源：

JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY | 1988年 / 3卷 / 06期

关键词：

D O I：

10.1039/ja9880300923

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：923 / 926

页数：4

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