CHARACTERIZATION OF TIPS FOR CONDUCTING ATOMIC-FORCE MICROSCOPY

被引：76
作者：
OSHEA, SJ
ATTA, RM
WELLAND, ME
机构：
[1] Department of Engineering, Cambridge University
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 03期
关键词：
D O I：
10.1063/1.1145649
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The conductivity of a variety of atomic force microscopy tips was investigated by measuring both current-voltage characteristics and force profile data for the tip in contact with graphite. This allows the conductivity to be studied as a function of tip-sample distance. It was found that etched gold wires or levers coated with a conducting diamond film were the best tips to use for experimentation on hard (SiO2) surfaces. Metal-coated levers, particularly gold, were found to wear rapidly such that the very end of the tip became insulating. © 1995 American Institute of Physics.
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页码：2508 / 2512
页数：5
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