CHARACTERIZATION OF TIPS FOR CONDUCTING ATOMIC-FORCE MICROSCOPY

被引：76

作者：

OSHEA, SJ

ATTA, RM

WELLAND, ME

机构：

[1] Department of Engineering, Cambridge University

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 03期

关键词：

D O I：

10.1063/1.1145649

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The conductivity of a variety of atomic force microscopy tips was investigated by measuring both current-voltage characteristics and force profile data for the tip in contact with graphite. This allows the conductivity to be studied as a function of tip-sample distance. It was found that etched gold wires or levers coated with a conducting diamond film were the best tips to use for experimentation on hard (SiO2) surfaces. Metal-coated levers, particularly gold, were found to wear rapidly such that the very end of the tip became insulating. © 1995 American Institute of Physics.

引用

页码：2508 / 2512

页数：5

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