EFFECT OF SURFACE-ROUGHNESS ON DIELECTRIC STRENGTH OF THICK-FILM DIELECTRICS

[1] FABER KT, 1980, PHYS CHEM GLASSES, V21, P171

[2] GOTTARDI V, 1982, GLASS MICROSTRUCTURE, P461

[3] HENCH LL, 1972, ELECTRICAL PROPERTIE, P583

[4] KARDASHIAN VS, 1977, IEEE T COMPON HYBRID, V2, P232

[5] KUMAR B, 1979, PHYS CHEM GLASSES, V20, P119

[6] LAWLESS WN, 1975, CRYOGENICS, V5, P273

[7] EFFECT OF RAPID COOLING ON THE GRAIN-BOUNDARY CONDUCTIVITY OF YTTRIA PARTIALLY-STABILIZED ZIRCONIA [J]. JOURNAL OF MATERIALS SCIENCE LETTERS, 1986, 5 (09) : 893 - 894

[8] ODWYER JJ, 1973, THEORY ELECTRICAL CO

[9] DETERMINATION OF PERCENT CRYSTALLINITY OF PARTLY DEVITRIFIED GLASS BY X-RAY DIFFRACTION [J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1962, 45 (04) : 170 - 171

[10] Riemer D. E., 1985, Proceedings of the 1985 International Symposium on Microelectronics, P52

[1] FABER KT, 1980, PHYS CHEM GLASSES, V21, P171

[2] GOTTARDI V, 1982, GLASS MICROSTRUCTURE, P461

[3] HENCH LL, 1972, ELECTRICAL PROPERTIE, P583

[4] KARDASHIAN VS, 1977, IEEE T COMPON HYBRID, V2, P232

[5] KUMAR B, 1979, PHYS CHEM GLASSES, V20, P119

[6] LAWLESS WN, 1975, CRYOGENICS, V5, P273

[7] EFFECT OF RAPID COOLING ON THE GRAIN-BOUNDARY CONDUCTIVITY OF YTTRIA PARTIALLY-STABILIZED ZIRCONIA [J]. JOURNAL OF MATERIALS SCIENCE LETTERS, 1986, 5 (09) : 893 - 894

[8] ODWYER JJ, 1973, THEORY ELECTRICAL CO

[9] DETERMINATION OF PERCENT CRYSTALLINITY OF PARTLY DEVITRIFIED GLASS BY X-RAY DIFFRACTION [J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1962, 45 (04) : 170 - 171

[10] Riemer D. E., 1985, Proceedings of the 1985 International Symposium on Microelectronics, P52