HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY OF AMORPHOUS-GERMANIUM AND SILICON FILMS

被引：0

作者：

SCHRODER, B ^{[1
]}

机构：

[1] UNIV TRIER KAISERSLAUTERN,FACHBEREICH PHYS,KAISERSLAUTERN,WEST GERMANY

来源：

BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1974年 / 19卷 / 03期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：388 / 388

页数：1

共 50 条

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