HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY OF AMORPHOUS-GERMANIUM AND SILICON FILMS

被引：0
作者：
SCHRODER, B [1 ]
机构：
[1] UNIV TRIER KAISERSLAUTERN,FACHBEREICH PHYS,KAISERSLAUTERN,WEST GERMANY
来源：
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1974年 / 19卷 / 03期
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D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
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页码：388 / 388
页数：1
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