EFFECTS OF PHOTOELECTRON MIGRATION ON X-RAY DEPOSITION IN COMPOSITE-MATERIALS

被引：0

作者：

PARKS, DE ^{[1
]}

FISHER, RH ^{[1
]}

机构：

[1] SYST SCI & SOFTWARE, LAJOLLA, CA 92037 USA

来源：

TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY | 1973年 / 16卷 / JUN期

关键词：

D O I：

暂无

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

引用

页码：355 / 355

页数：1

共 50 条

[11] Chemical Analysis of Materials with X-ray Photoelectron Spectroscopy
Quadrelli, A.
Jarvis, S. P.
SURFACE COATINGS INTERNATIONAL, 2022, 105 (05): : 382 - 383
[12] X-ray curing of composite materials
Berejka, AJ
Cleland, MR
Galloway, RA
Gregoire, O
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2005, 241 (1-4) : 847 - 849
[13] X-RAY PHOTOELECTRON STUDY OF THE SURFACE OF INORGANIC MATERIALS
NEFEDOV, VI
INORGANIC MATERIALS, 1984, 20 (06) : 819 - 825
[14] X-ray photoelectron spectroscopy on zeolites and related materials
Stocker, M
MICROPOROUS MATERIALS, 1996, 6 (5-6): : 235 - 257
[15] X-ray photoelectron spectroscopy on zeolites and related materials
SINTEF Chemistry in Oslo, Oslo, Norway
Microporous Mater, 5-6 (235-257):
[16] PHOTOELECTRON EFFECTS IN X-RAY MASK REPLICATION
WHITE, V
OCOLA, L
CERRINA, F
VLADIMIRSKY, Y
MALDONADO, J
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (06): : 3270 - 3274
[17] X-ray photoelectron spectroscopic study of composite glass fillers
Simon, V.
Colceriu, A.
Prejmerean, C.
Moldovan, M.
Prinz, M.
Neumann, M.
JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2007, 9 (11): : 3350 - 3353
[18] THE EFFECTS OF PHOTOELECTRON DIFFRACTION ON QUANTITATIVE X-RAY PHOTOELECTRON-SPECTROSCOPY
BISHOP, HE
SURFACE AND INTERFACE ANALYSIS, 1991, 17 (04) : 197 - 202
[19] THE MIGRATION OF METAL MELTS IN SINTERED COMPOSITE-MATERIALS
LISOVSKY, AF
INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER, 1990, 33 (08) : 1599 - 1603
[20] X-RAY PHOTOELECTRON-SPECTROSCOPY APPLIED TO MICROELECTRONIC MATERIALS
STICKLE, WF
BOMBEN, KD
ACS SYMPOSIUM SERIES, 1986, 295 : 144 - 162

← 1 2 3 4 5 →