ELECTRON-PROBE MICROANALYSIS IN A SCANNING ELECTRON-MICROSCOPE

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作者：

VASICHEV, BN

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SOVIET JOURNAL OF OPTICAL TECHNOLOGY | 1979年 / 46卷 / 11期

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O43 [光学];

学科分类号：

070207 ; 0803 ;

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页码：683 / 689

页数：7

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