ELECTRON-PROBE MICROANALYSIS IN A SCANNING ELECTRON-MICROSCOPE

被引：0

作者：

VASICHEV, BN

机构：

来源：

SOVIET JOURNAL OF OPTICAL TECHNOLOGY | 1979年 / 46卷 / 11期

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D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：683 / 689

页数：7

共 50 条

[1] DETERMINATION OF THE DIAMETER OF THE ELECTRON-PROBE OF A SCANNING ELECTRON-MICROSCOPE
NOVIKOV, YA
RAKOV, AV
STEKOLIN, IY
STRIZHKOV, IB
MEASUREMENT TECHNIQUES USSR, 1993, 36 (12): : 1348 - 1350
[2] SCANNING ELECTRON-MICROSCOPE AND OTHER ELECTRON-PROBE INSTRUMENTS
OATLEY, C
PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1975, 122 (09): : 942 - 946
[3] MEASURING THE DIAMETER OF AN ELECTRON-PROBE WITH A SCANNING ELECTRON-MICROSCOPE
NOVIKOV, YA
RAKOV, AV
STEKOLIN, IY
MEASUREMENT TECHNIQUES USSR, 1995, 38 (01): : 46 - 49
[4] SCANNING ELECTRON-PROBE MICROANALYSIS
HEINRICH, KFJ
ADVANCES IN OPTICAL & ELECTRON MICROSCOPY, 1975, 6 : 275 - 301
[5] SCANNING ELECTRON-PROBE MICROANALYSIS
DUNCUMB, P
INSTITUTE OF PHYSICS CONFERENCE SERIES, 1993, (130): : 43 - 52
[6] SCANNING ELECTRON-MICROSCOPE CALIBRATION WITH SIMULTANEOUS ELECTRON-PROBE DIAMETER DETERMINATION
NOVIKOV, YA
RAKOV, AV
STEKOLIN, IY
MEASUREMENT TECHNIQUES USSR, 1994, 37 (06): : 710 - 713
[7] EVALUATION OF ELECTRON-PROBE THERMAL ACTION IN SCANNING ELECTRON-MICROSCOPY AND ELECTRON-PROBE MICROANALYSIS
FILIPPOV, MN
IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA, 1993, 57 (08): : 165 - 171
[8] STABILIZATION OF ELECTRON-PROBE CURRENT IN SCANNING ELECTRON-MICROSCOPE WITH A FIELD-EMISSION CATHODE
CLEAVER, JRA
INTERNATIONAL JOURNAL OF ELECTRONICS, 1975, 38 (04) : 531 - 540
[9] ELECTRON-PROBE MICROANALYSIS
FUJINO, T
MIZUHIRA, V
JAPAN ANALYST, 1974, : R42 - R46
[10] ELECTRON-PROBE MICROANALYSIS
HALL, TA
GUPTA, BL
MORETON, RB
TRENDS IN BIOCHEMICAL SCIENCES, 1977, 2 (02) : N39 - N40

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