GENERALIZED ELECTRON-BEAM MATCHING IN THE FREE-ELECTRON LASER

被引：3
作者：
ELLIOTT, CJ
机构：
[1] Los Alamos National Laboratory, Los Alamos
来源：
IEEE JOURNAL OF QUANTUM ELECTRONICS | 1991年 / 27卷 / 12期
关键词：
D O I：
10.1109/3.104147
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Three matching schemes are presented for Gaussian profile electron beams in free-electron lasers (FEL's). The new schemes are distinct generalizations of well-known betatron matching and include ribbon profiles. The corresponding effective energy distributions and their Fourier transforms are obtained in analytical form. An analytical kernel produces the key Fredholm integral equation that solves the initial value problem.
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页码：2667 / 2672
页数：6
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