QUANTITATIVE ELECTRON-PROBE MICROANALYSIS FOR THE CHARACTERIZATION OF THIN CARBON-BORON LAYERS IN FUSION DEVICES

被引:10
作者
KARDUCK, P [1 ]
AMMANN, N [1 ]
ESSER, HG [1 ]
WINTER, J [1 ]
机构
[1] FORSCHUNGSZENTRUM JULICH GMBH,INST PLASMAPHYS,EURATOM,KFA,W-5170 JULICH,GERMANY
来源
FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY | 1991年 / 341卷 / 5-6期
关键词
D O I
10.1007/BF00321926
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The first wall of the fusion device TEXTOR at the Forschungszentrum Julich has been coated in situ with an amorphous hydrogen rich carbon/boron film (a-C/B:H) which reduces plasma impurities caused by the plasma surface interaction. The results of the coating process of the 35 m2 large inner wall surface have been controlled by a recently developed modification of the quantitative electron probe microanalysis, which has been applied to 12 samples from specified positions inside the tokamak. The quantification itself is based on a Monte Carlo simulation of electron trajectories providing very accurate results for X-ray intensities emitted by elements present in the electron bombarded sample. The Monte Carlo results are used in the present work to calibrate the measured X-ray intensities emitted by boron and carbon from the a-C/B:H layers deposited on pure silicon substrates. As a result the total deposited mass of the layer per area unit as well as the composition of the layers (except hydrogen) could be determined very accurately. The relative errors were less than 7%. The limit of detectability were found to be in the range of one monolayer for boron as well as for carbon.
引用
收藏
页码:315 / 319
页数:5
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