RELATION BETWEEN THE WIDTH OF AN X-RAY LINE AND THE RESOLVING POWER OF THE DOUBLE-CRYSTAL SPECTROMETER

被引:4
|
作者
BROGREN, G
机构
来源
PHYSICAL REVIEW | 1954年 / 96卷 / 03期
关键词
D O I
10.1103/PhysRev.96.589
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:589 / 589
页数:1
相关论文
共 50 条
  • [21] The Resolution Function of a Double-Crystal X-ray Diffractometer
    Pashaev, E. M.
    Subbotin, I. A.
    Chuev, M. A.
    Kvardakov, V. V.
    Golovanov, A. E.
    Likhachev, I. A.
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 2009, 52 (05) : 712 - 720
  • [22] DOUBLE-CRYSTAL SPECTROMETER ATTACHMENT TO THE WIDE-RANGE GONIOMETER OF THE NORELCO X-RAY DIFFRACTOMETER
    MALOOF, SR
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1956, 27 (03): : 146 - 147
  • [23] DOUBLE-CRYSTAL X-RAY TOPOGRAPHIC DTS-1 SPECTROMETER FOR INVESTIGATING DEFECTS IN CRYSTALS
    MIUSKOV, VF
    MIRENSKI.AV
    SHILIN, YN
    GASANOV, NG
    KRISTALLOGRAFIYA, 1974, 19 (01): : 153 - 159
  • [24] Content analyses in GaMnAs by double-crystal X-ray diffraction
    Chen, NF
    Xiu, HX
    Yang, JL
    Wu, JL
    Zhong, XR
    Lin, LY
    CHINESE SCIENCE BULLETIN, 2002, 47 (04): : 274 - 275
  • [25] A MULTIBEAM X-RAY TOPOGRAPHIC METHOD FOR A DOUBLE-CRYSTAL ARRANGEMENT
    CHANG, SL
    JOURNAL OF APPLIED PHYSICS, 1982, 53 (04) : 2988 - 2990
  • [26] A DOUBLE-CRYSTAL X-RAY GONIOMETER FOR ACCURATE ORIENTATION DETERMINATION
    BOND, WL
    PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1950, 38 (08): : 886 - 889
  • [27] A GRAPHITE DOUBLE-CRYSTAL MONOCHROMATOR FOR X-RAY SYNCHROTRON RADIATION
    HOHLWEIN, D
    SIDDONS, DP
    HASTINGS, JB
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1988, 21 (06) : 911 - 915
  • [28] AN AUTOMATIC FLANK CONTROL FOR DOUBLE-CRYSTAL X-RAY TOPOGRAPHY
    BONSE, U
    LOTSCH, H
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1981, 14 (11): : 1248 - 1249
  • [29] A vacuum double-crystal spectrometer for reference-free X-ray spectroscopy of highly charged ions
    Amaro, P.
    Szabo, C. I.
    Schlesser, S.
    Gumberidze, A.
    Kessler, E. G., Jr.
    Henins, A.
    Le Bigot, E. O.
    Trassinelli, M.
    Isac, J. M.
    Travers, P.
    Guerra, M.
    Santos, J. P.
    Indelicato, P.
    RADIATION PHYSICS AND CHEMISTRY, 2014, 98 : 132 - 149
  • [30] DETERMINATION OF INTERFACE COHERENCY BY X-RAY DOUBLE-CRYSTAL DIFFRACTION
    ZHU, NC
    LI, RS
    CHEN, JY
    XU, SS
    JOURNAL OF APPLIED PHYSICS, 1994, 75 (06) : 2805 - 2808