UNDERSTANDING OF THE TEMPERATURE-DEPENDENCE OF CHANNEL HOT-CARRIER DEGRADATION IN THE RANGE 77-K TO 300-K

被引：0
|
作者：
HEREMANS, P
VANDENBOSCH, G
BELLENS, R
GROESENEKEN, G
MAES, HE
机构：
来源：
1989 INTERNATIONAL ELECTRON DEVICES MEETING, TECHNICAL DIGEST | 1989年
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页码：67 / 70
页数：4
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