UNDERSTANDING OF THE TEMPERATURE-DEPENDENCE OF CHANNEL HOT-CARRIER DEGRADATION IN THE RANGE 77-K TO 300-K

被引:0
|
作者
HEREMANS, P
VANDENBOSCH, G
BELLENS, R
GROESENEKEN, G
MAES, HE
机构
来源
1989 INTERNATIONAL ELECTRON DEVICES MEETING, TECHNICAL DIGEST | 1989年
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暂无
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:67 / 70
页数:4
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