APPARATUS FOR TESTING AMORPHOUS-SEMICONDUCTOR SWITCHES

被引：0

作者：

SEMENOV, VA

ORESHKIN, PT

SOKOLOV, BM

机构：

来源：

MEASUREMENT TECHNIQUES | 1973年 / 16卷 / 01期

关键词：

D O I：

10.1007/BF00816702

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：109 / 110

页数：2

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