APPARATUS FOR TESTING AMORPHOUS-SEMICONDUCTOR SWITCHES

被引：0

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作者：

SEMENOV, VA

ORESHKIN, PT

SOKOLOV, BM

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来源：

MEASUREMENT TECHNIQUES | 1973年 / 16卷 / 01期

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D O I：

10.1007/BF00816702

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T [工业技术];

学科分类号：

08 ;

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页码：109 / 110

页数：2

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