APPARATUS FOR TESTING AMORPHOUS-SEMICONDUCTOR SWITCHES

被引：0
|
作者：
SEMENOV, VA
ORESHKIN, PT
SOKOLOV, BM
机构：
来源：
MEASUREMENT TECHNIQUES | 1973年 / 16卷 / 01期
关键词：
D O I：
10.1007/BF00816702
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：109 / 110
页数：2
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