ON THE TRANSITION FROM TUNNELING REGIME TO POINT-CONTACT - GRAPHITE

被引:19
作者
AGRAIT, N
RODRIGO, JG
VIEIRA, S
机构
[1] Laboratorio de Bajas Temperaturas, Departamento Física de la Materia Condensada, C-III
关键词
D O I
10.1016/0304-3991(92)90263-J
中图分类号
TH742 [显微镜];
学科分类号
摘要
In this paper we present a model of the transition from tunneling regime to point-contact that shows how density-of-states features may appear in current-voltage characteristics between these two limits. This transition is gradual and there is no clear-cut point separating both situations. We also give a semiquantitative account of the variation of conductance with tip and sample distance in STS (scanning tunneling spectroscopy performed with a STM) and apply this model to the interpretation of spectroscopic results obtained in graphite, We also show that it is possible to have atomic resolution with very low tunneling resistances (approximately 1 k-OMEGA) and high currents (approximately 10-mu-A). Under these conditions the forces between tip and sample appear clearly in the topographic images as distortions. These forces vary qualitatively with temperature in the range 4-300 K.
引用
收藏
页码:177 / 183
页数:7
相关论文
共 15 条
  • [1] AGRAIT N, IN PRESS REV SCI INS
  • [2] BINNIG G, 1986, IBM J RES DEV, V30, P355
  • [3] ELECTRON METAL-SURFACE INTERACTION POTENTIAL WITH VACUUM TUNNELING - OBSERVATION OF THE IMAGE FORCE
    BINNIG, G
    GARCIA, N
    ROHRER, H
    SOLER, JM
    FLORES, F
    [J]. PHYSICAL REVIEW B, 1984, 30 (08): : 4816 - 4818
  • [4] TRANSITION FROM METALLIC TO TUNNELING REGIMES IN SUPERCONDUCTING MICRO-CONSTRICTIONS - EXCESS CURRENT, CHARGE IMBALANCE, AND SUPER-CURRENT CONVERSION
    BLONDER, GE
    TINKHAM, M
    KLAPWIJK, TM
    [J]. PHYSICAL REVIEW B, 1982, 25 (07): : 4515 - 4532
  • [5] FEENSTRA RM, 1987, SURF SCI, V181, P259
  • [6] TRANSITION FROM THE TUNNELING REGIME TO POINT CONTACT STUDIED USING SCANNING TUNNELING MICROSCOPY
    GIMZEWSKI, JK
    MOLLER, R
    [J]. PHYSICAL REVIEW B, 1987, 36 (02): : 1284 - 1287
  • [7] POINT-CONTACT SPECTROSCOPY IN METALS
    JANSEN, AGM
    VANGELDER, AP
    WYDER, P
    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1980, 13 (33): : 6073 - 6118
  • [8] APPARENT BARRIER HEIGHT IN SCANNING TUNNELING MICROSCOPY
    LANG, ND
    [J]. PHYSICAL REVIEW B, 1988, 37 (17): : 10395 - 10398
  • [9] CONTAMINATION-MEDIATED DEFORMATION OF GRAPHITE BY THE SCANNING TUNNELING MICROSCOPE
    MAMIN, HJ
    GANZ, E
    ABRAHAM, DW
    THOMSON, RE
    CLARKE, J
    [J]. PHYSICAL REVIEW B, 1986, 34 (12): : 9015 - 9018
  • [10] DIRECT MEASUREMENT OF FORCES DURING SCANNING TUNNELING MICROSCOPE IMAGING OF GRAPHITE
    MATE, CM
    ERLANDSSON, R
    MCCLELLAND, GM
    CHIANG, S
    [J]. SURFACE SCIENCE, 1989, 208 (03) : 473 - 486