AN ALGORITHMIC APPROACH TO INCREASED RELIABILITY THROUGH STANDBY REDUNDANCY

被引:27
作者
ROBINSON, DG [1 ]
NEUTS, MF [1 ]
机构
[1] UNIV ARIZONA,COLL ENGN & MINES,DEPT SYST & IND ENGN,TUCSON,AZ 85721
关键词
D O I
10.1109/24.46457
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:430 / 435
页数:6
相关论文
共 9 条
[1]  
AHMAD SH, 1985, MICROELECTRON RELIAB, V25, P621
[2]   PROFIT ANALYSIS OF A COLD STANDBY SYSTEM WITH 2 REPAIR DISTRIBUTIONS [J].
GOEL, LR ;
GUPTA, R ;
SINGH, SK .
MICROELECTRONICS AND RELIABILITY, 1985, 25 (03) :467-472
[3]   19 DUBIOUS WAYS TO COMPUTE EXPONENTIAL OF A MATRIX [J].
MOLER, C ;
VANLOAN, C .
SIAM REVIEW, 1978, 20 (04) :801-836
[4]  
Neuts M., 1981, MATRIX GEOMETRIC SOL
[5]  
Neuts M. F., 1981, OR Spektrum, V2, P227, DOI 10.1007/BF01721011
[6]   SHOCK-MODELS WITH PHASE TYPE SURVIVAL AND SHOCK RESISTANCE [J].
NEUTS, MF ;
BHATTACHARJEE, MC .
NAVAL RESEARCH LOGISTICS, 1981, 28 (02) :213-219
[7]   OPTIMUM PREVENTIVE MAINTENANCE POLICY FOR 2-UNIT PRIORITY STANDBY REDUNDANT SYSTEM WITH MINIMAL REPAIR [J].
OHASHI, M ;
ADACHI, K ;
KODAMA, M .
MICROELECTRONICS AND RELIABILITY, 1978, 18 (06) :535-538
[8]   REPLACEMENT VS REPAIR OF FAILED COMPONENTS FOR A SYSTEM WITH A RANDOM LIFETIME [J].
WELLS, CE .
IEEE TRANSACTIONS ON RELIABILITY, 1988, 37 (03) :280-286
[9]   STANDBY REDUNDANCY IN RELIABILITY - A REVIEW [J].
YEAROUT, RD ;
REDDY, P ;
GROSH, DL .
IEEE TRANSACTIONS ON RELIABILITY, 1986, 35 (03) :285-292