SCATTERING-THEORETIC APPROACH TO THE ELECTRONIC-STRUCTURE OF SEMICONDUCTOR SURFACES - (100) SURFACE OF TETRAHEDRAL SEMICONDUCTORS AND SIO2

被引：164

作者：

POLLMANN, J ^{[1
]}

PANTELIDES, ST ^{[1
]}

机构：

[1] IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA

来源：

PHYSICAL REVIEW B | 1978年 / 18卷 / 10期

关键词：

D O I：

10.1103/PhysRevB.18.5524

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：5524 / 5544

页数：21

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