SCATTERING-THEORETIC APPROACH TO THE ELECTRONIC-STRUCTURE OF SEMICONDUCTOR SURFACES - (100) SURFACE OF TETRAHEDRAL SEMICONDUCTORS AND SIO2

被引：164
|
作者：
POLLMANN, J [1 ]
PANTELIDES, ST [1 ]
机构：
[1] IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
来源：
PHYSICAL REVIEW B | 1978年 / 18卷 / 10期
关键词：
D O I：
10.1103/PhysRevB.18.5524
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：5524 / 5544
页数：21
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