GONIOMETER FOR X-RAY EXPERIMENTS ON MU-FINE METAL FILAMENT REAL STRUCTURES OPERATING ACCORDING TO A DOUBLE-CRYSTAL SPECTROMETER METHOD

被引：0
|
作者：
OBERENDER, W
SCHIMMEL, G
SCHULZE, KJ
机构：
来源：
MESSTECHNIK | 1968年 / 76卷 / 04期
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D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
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页码：83 / +
页数：1
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