GONIOMETER FOR X-RAY EXPERIMENTS ON MU-FINE METAL FILAMENT REAL STRUCTURES OPERATING ACCORDING TO A DOUBLE-CRYSTAL SPECTROMETER METHOD

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作者：

OBERENDER, W

SCHIMMEL, G

SCHULZE, KJ

机构：

来源：

MESSTECHNIK | 1968年 / 76卷 / 04期

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D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

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页码：83 / +

页数：1

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