PROCEDURES AND STANDARDS FOR ACCURATE SPECTROPHOTOMETRIC MEASUREMENTS OF SPECULAR REFLECTANCE

被引:32
|
作者
ZWINKELS, JC
NOEL, M
DODD, CX
机构
[1] Institute for National Measurement Standards, National Research Council of Canada, Ottawa, ON
关键词
SPECULAR REFLECTANCE STANDARDS; SPECTROPHOTOMETRIC METROLOGY; ABSOLUTE REFLECTANCE (NORMAL INCIDENCE); RELATIVE REFLECTANCE (OBLIQUE INCIDENCE);
D O I
10.1364/AO.33.007933
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Procedures and standards that have been developed at the National Research Council of Canada for the accurate measurement of specular reflectance are discussed for both absolute and relative methods over the spectral range 250 to 2500 nm. There has been an increasing demand for these types of measurements, particularly for coated samples approaching the extremes of 0% reflectance and 100% reflectance. In some applications of these coatings, such as energy conservation and control, conventional methods of measuring specular reflectance give insufficient accuracies for the prediction of optical performance. Details of alignment procedures for both absolute and relative reflectance methods, the preparation and application of several candidate reflectance standards, and the compensation, attenuation, and verification procedures that have been developed to improve the precision and accuracy of specular reflectance measurements are described. Using these various techniques, one can routinely achieve accuracies of 0.3% reflectance at reflectance values as high as 97% and as low as 4%.
引用
收藏
页码:7933 / 7944
页数:12
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