CHARACTERIZATION AND COMPARISON OF MICROSTRUCTURES IN THE SHAPED-CHARGE REGIME - COPPER AND TANTALUM

被引：42

作者：

GUREVITCH, AC ^{[1
]}

MURR, LE ^{[1
]}

SHIH, HK ^{[1
]}

NIOU, CS ^{[1
]}

ADVANI, AH ^{[1
]}

MANUEL, D ^{[1
]}

ZERNOW, L ^{[1
]}

机构：

[1] ZERNOW TECH SERV INC,SAN DIMAS,CA 91773

来源：

MATERIALS CHARACTERIZATION | 1993年 / 30卷 / 03期

关键词：

Light microscopy - Shaped charge regime;

D O I：

10.1016/1044-5803(93)90022-N

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Light microscopy, scanning electron microscopy, and transmission electron microscopy techniques were employed, along with a novel technique for building up small, recovered jet fragments using electrodeposition of copper, to examine specific segments of fabricated shaped charge liner cones and corresponding, residual jet fragments. Oxygen-free electronic copper and tantalum shaped charge regimes (liner cones and recovered jet fragments) were compared, and a reduction in the average grain size of recovered jet fragments as compared to the starting liner cones was a consistent observation. The average grain sizes for all cones was 35mum, and the maximum grain reduction occurred for an annealed, equiaxed tantalum cone, which resulted in a residual jet fragment grain size between 1 and 5mum. This is indicative of dynamic recrystallization during jet elongation and microstructure evolution.

引用

页码：201 / 216

页数：16

共 15 条

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