THICKNESS MEASUREMENTS OF UNSATURATED SUPERFLUID HE-4 FILMS UNDER DRIVEN AND PERSISTENT FLOW

被引：10
|
作者：
EKHOLM, DT [1 ]
HALLOCK, RB [1 ]
机构：
[1] UNIV MASSACHUSETTS,DEPT PHYS & ASTRON,LOW TEMP PHYS LAB,AMHERST,MA 01003
来源：
JOURNAL OF LOW TEMPERATURE PHYSICS | 1981年 / 42卷 / 3-4期
关键词：
D O I：
10.1007/BF00120210
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：339 / 361
页数：23
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