THICKNESS MEASUREMENTS OF UNSATURATED SUPERFLUID HE-4 FILMS UNDER DRIVEN AND PERSISTENT FLOW

被引：10

作者：

EKHOLM, DT ^{[1
]}

HALLOCK, RB ^{[1
]}

机构：

[1] UNIV MASSACHUSETTS,DEPT PHYS & ASTRON,LOW TEMP PHYS LAB,AMHERST,MA 01003

来源：

关键词：

D O I：

10.1007/BF00120210

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：339 / 361

页数：23

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