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INFLUENCE OF BAND STRUCTURE ON AUGER ELECTRON SPECTRUM OF SILICON
被引:24
作者
:
MAGUIRE, HG
论文数:
0
引用数:
0
h-index:
0
MAGUIRE, HG
AGUSTUS, PD
论文数:
0
引用数:
0
h-index:
0
AGUSTUS, PD
机构
:
来源
:
JOURNAL OF PHYSICS PART C SOLID STATE PHYSICS
|
1971年
/ 4卷
/ 09期
关键词
:
D O I
:
10.1088/0022-3719/4/9/012
中图分类号
:
O469 [凝聚态物理学];
学科分类号
:
070205 ;
摘要
:
引用
收藏
页码:L174 / &
相关论文
共 18 条
[1]
BAND STRUCTURE OF SILICON BY CHARACTERISTIC AUGER ELECTRON SPECTRUM ANALYSIS
AMELIO, GF
论文数:
0
引用数:
0
h-index:
0
AMELIO, GF
[J].
SURFACE SCIENCE,
1970,
22
(02)
: 301
-
&
[2]
REEVALUATION OF X-RAY ATOMIC ENERGY LEVELS
BEARDEN, JA
论文数:
0
引用数:
0
h-index:
0
BEARDEN, JA
BURR, AF
论文数:
0
引用数:
0
h-index:
0
BURR, AF
[J].
REVIEWS OF MODERN PHYSICS,
1967,
39
(01)
: 125
-
&
[3]
BERGSTROM I, 1954, ARK FYS, V8, P21
[4]
AUGER SPECTROSCOPY OF SILICON
BISHOP, HE
论文数:
0
引用数:
0
h-index:
0
BISHOP, HE
RIVIERE, JC
论文数:
0
引用数:
0
h-index:
0
RIVIERE, JC
TAYLOR, NJ
论文数:
0
引用数:
0
h-index:
0
TAYLOR, NJ
[J].
SURFACE SCIENCE,
1969,
17
(02)
: 462
-
&
[5]
DIFFUSION OF NICKEL IN SILICON
BONZEL, HP
论文数:
0
引用数:
0
h-index:
0
BONZEL, HP
[J].
PHYSICA STATUS SOLIDI,
1967,
20
(02):
: 493
-
&
[6]
BURHOP EHS, 1952, AUGER EFFECT, P1
[7]
CONTAMINANTS ON CHEMICALLY ETCHED SILICON SURFACES - LEED-AUGER METHOD
CHANG, CC
论文数:
0
引用数:
0
h-index:
0
CHANG, CC
[J].
SURFACE SCIENCE,
1970,
23
(02)
: 283
-
&
[8]
AUGER ELECTRON ENERGIES OF OUTER SHELL ELECTRONS
CHUNG, MF
论文数:
0
引用数:
0
h-index:
0
CHUNG, MF
JENKINS, LH
论文数:
0
引用数:
0
h-index:
0
JENKINS, LH
[J].
SURFACE SCIENCE,
1970,
22
(02)
: 479
-
&
[9]
AUGER ELECTRON SPECTROSCOPY OF SI
GRANT, JT
论文数:
0
引用数:
0
h-index:
0
GRANT, JT
HAAS, TW
论文数:
0
引用数:
0
h-index:
0
HAAS, TW
[J].
SURFACE SCIENCE,
1970,
23
(02)
: 347
-
&
[10]
GROVE AS, 1967, PHYS TECHNOL S, P346
←
1
2
→
共 18 条
[1]
BAND STRUCTURE OF SILICON BY CHARACTERISTIC AUGER ELECTRON SPECTRUM ANALYSIS
AMELIO, GF
论文数:
0
引用数:
0
h-index:
0
AMELIO, GF
[J].
SURFACE SCIENCE,
1970,
22
(02)
: 301
-
&
[2]
REEVALUATION OF X-RAY ATOMIC ENERGY LEVELS
BEARDEN, JA
论文数:
0
引用数:
0
h-index:
0
BEARDEN, JA
BURR, AF
论文数:
0
引用数:
0
h-index:
0
BURR, AF
[J].
REVIEWS OF MODERN PHYSICS,
1967,
39
(01)
: 125
-
&
[3]
BERGSTROM I, 1954, ARK FYS, V8, P21
[4]
AUGER SPECTROSCOPY OF SILICON
BISHOP, HE
论文数:
0
引用数:
0
h-index:
0
BISHOP, HE
RIVIERE, JC
论文数:
0
引用数:
0
h-index:
0
RIVIERE, JC
TAYLOR, NJ
论文数:
0
引用数:
0
h-index:
0
TAYLOR, NJ
[J].
SURFACE SCIENCE,
1969,
17
(02)
: 462
-
&
[5]
DIFFUSION OF NICKEL IN SILICON
BONZEL, HP
论文数:
0
引用数:
0
h-index:
0
BONZEL, HP
[J].
PHYSICA STATUS SOLIDI,
1967,
20
(02):
: 493
-
&
[6]
BURHOP EHS, 1952, AUGER EFFECT, P1
[7]
CONTAMINANTS ON CHEMICALLY ETCHED SILICON SURFACES - LEED-AUGER METHOD
CHANG, CC
论文数:
0
引用数:
0
h-index:
0
CHANG, CC
[J].
SURFACE SCIENCE,
1970,
23
(02)
: 283
-
&
[8]
AUGER ELECTRON ENERGIES OF OUTER SHELL ELECTRONS
CHUNG, MF
论文数:
0
引用数:
0
h-index:
0
CHUNG, MF
JENKINS, LH
论文数:
0
引用数:
0
h-index:
0
JENKINS, LH
[J].
SURFACE SCIENCE,
1970,
22
(02)
: 479
-
&
[9]
AUGER ELECTRON SPECTROSCOPY OF SI
GRANT, JT
论文数:
0
引用数:
0
h-index:
0
GRANT, JT
HAAS, TW
论文数:
0
引用数:
0
h-index:
0
HAAS, TW
[J].
SURFACE SCIENCE,
1970,
23
(02)
: 347
-
&
[10]
GROVE AS, 1967, PHYS TECHNOL S, P346
←
1
2
→