EXPERIMENTAL-STUDY OF SYMMETRIC MICROSTRIP BENDS AND THEIR COMPENSATION

被引：74

作者：

DOUVILLE, RJP

JAMES, DS

机构：

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1978年 / 26卷 / 03期

关键词：

D O I：

10.1109/TMTT.1978.1129340

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：175 / 182

页数：8

相关论文

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