THE ILLUMINATING SYSTEM OF THE ELECTRON MICROSCOPE

被引：10
|
作者：
HILLIER, J
ELLIS, SG
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1949年 / 20卷 / 07期
关键词：
D O I：
10.1063/1.1698511
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：700 / 706
页数：7
相关论文
共 50 条
  • [31] A new electron microscope system for pattern placement metrology
    Bosse, H
    Hassler-Grohne, W
    17TH ANNUAL SYMPOSIUM ON PHOTOMASK TECHNOLOGY AND MANAGEMENT, 1998, 3236 : 160 - 169
  • [32] The scanning electron microscope as sensor system for mobile microrobots
    Schmoeckel, F
    Wörn, H
    Kiefer, M
    ETFA 2001: 8TH IEEE INTERNATIONAL CONFERENCE ON EMERGING TECHNOLOGIES AND FACTORY AUTOMATION, VOL 2, PROCEEDINGS, 2001, : 599 - 602
  • [33] A MICROPROCESSOR SYSTEM ASSOCIATED WITH A MIRROR ELECTRON-MICROSCOPE
    GUIVARCH, M
    BABOUT, M
    GUITTARD, C
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1980, 13 (05): : 497 - 499
  • [34] A SCANNING ELECTRON-MICROSCOPE BASED MICROINDENTATION SYSTEM
    DANIEL, AM
    SMITH, ST
    LEWIS, MH
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1994, 65 (03) : 632 - 638
  • [35] AUTO-FOCUS SYSTEM OF ELECTRON-MICROSCOPE
    SAKATA, S
    JOURNAL OF ELECTRON MICROSCOPY, 1979, 28 (03): : 227 - 227
  • [36] CameraMan: A multirobot system for nanohandling in a scanning electron microscope
    Fatikow, S.
    Jasper, D.
    Edeler, C.
    Dahmen, C.
    2008 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND AUTOMATION, VOLS 1-9, 2008, : 437 - 442
  • [37] NEW VACUUM-SYSTEM FOR AN ELECTRON-MICROSCOPE
    YOSHIMURA, N
    OHMORI, S
    NAGAHAMA, Y
    OIKAWA, H
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1974, : 249 - 252
  • [38] ELECTRON MICROSCOPE SYSTEM WITH ELECTRONIC RECORDING OF INTENSITY AND ENERGY
    HOLMES, RJ
    POLLARD, IE
    RYAN, CJ
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1970, 3 : 200 - &
  • [39] The troubling analysing and repairing of the vacuum system of electron microscope
    Chen, XW
    Shi, TZ
    Zhang, N
    Wu, J
    ELECTRON MICROSCOPY 1998, VOL 1: GENERAL INTEREST AND INSTRUMENTATION, 1998, : 39 - 40
  • [40] ELECTRON MICROSCOPE
    WILDHACK, WA
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1950, 21 (06) : 576 - 576
12345