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- [6] INFLUENCE OF THE TEMPERATURE-DEPENDENCE OF THE PERMITTIVITY ON THE CURRENT-VOLTAGE CHARACTERISTICS OF SEMICONDUCTOR DIODE STRUCTURES SOVIET PHYSICS SEMICONDUCTORS-USSR, 1981, 15 (07): : 819 - 820
- [7] METHOD FOR MEASUREMENT OF SEMICONDUCTOR DIODE CURRENT-VOLTAGE CHARACTERISTICS. Instruments and experimental techniques New York, 1980, 23 (1 pt 2): : 248 - 249
- [8] SIMULATIONS OF THE CURRENT-VOLTAGE CHARACTERISTICS OF SEMICONDUCTOR TUNNEL STRUCTURES GEC JOURNAL OF RESEARCH, 1987, 5 (02): : 65 - 75